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Study on the effects of the compression ratio and mushy zone heating on the thixotropic microstructure of AA 7075 aluminum alloy via SIMA process

Bolouri, Amir; Shahmiri, Mohammad; Kang, C. G.

Authors

Amir Bolouri Amir.Bolouri@uwe.ac.uk
Associate Professor in Manufacturing

Mohammad Shahmiri

C. G. Kang



Abstract

The effects of compression ratios on the microstructure evolution of semisolid Al7075 alloy produced by the strain induced melt activation (SIMA) process were investigated. The samples were cold deformed by compression into the different heights up to 40% reduction. The isothermal holding treatments within mushy zone of the alloy were carried out at 610, 620 and 625 °C for predetermined time intervals. The results revealed that the average grain size gradually reduced with the increase in the compressive ratio. While the compressive ratio surpassed 30%, the descending trend above was not as evident as that of below 30% reduction. The optimum condition presenting the minimum grain size and the maximum shape factor with the highest uniformity is discussed. During the subsequent mushy zone heating, the recrystallization was induced in the deformed samples by the increasingly accumulated strain energy. © 2010 Elsevier B.V. All rights reserved.

Citation

Bolouri, A., Shahmiri, M., & Kang, C. G. (2011). Study on the effects of the compression ratio and mushy zone heating on the thixotropic microstructure of AA 7075 aluminum alloy via SIMA process. Journal of Alloys and Compounds, 509(2), 402-408. https://doi.org/10.1016/j.jallcom.2010.09.042

Journal Article Type Article
Acceptance Date Sep 8, 2010
Online Publication Date Sep 17, 2010
Publication Date Jan 12, 2011
Journal Journal of Alloys and Compounds
Print ISSN 0925-8388
Publisher Elsevier
Peer Reviewed Peer Reviewed
Volume 509
Issue 2
Pages 402-408
DOI https://doi.org/10.1016/j.jallcom.2010.09.042
Keywords thermomechanical processing, 7075 aluminum alloys, semi-solid, SIMA
Public URL https://uwe-repository.worktribe.com/output/967121
Publisher URL http://dx.doi.org/10.1016/j.jallcom.2010.09.042