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Janice Kiely's Outputs (3)

Simplified tunnelling current calculation for MOS structures with ultra-thin oxides for conductive atomic force microscopy investigations (2005)
Journal Article

As charge tunnelling through thin and ultra-thin silicon dioxide layers is regarded as the driving force for MOS device degradation the determination and characterisation of electrically week spots is of paramount importance for device reliability an... Read More about Simplified tunnelling current calculation for MOS structures with ultra-thin oxides for conductive atomic force microscopy investigations.