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Dynamic deflectometry: A novel approach for the on-line reconstruction of specular freeform surfaces

Atkinson, Gary; Smith, Melvyn; Wedowski, Raphael D.; Smith, Lyndon

Authors

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Melvyn Smith Melvyn.Smith@uwe.ac.uk
Research Centre Director Vision Lab/Prof

Raphael D. Wedowski

Lyndon Smith Lyndon.Smith@uwe.ac.uk
Professor in Computer Simulation and Machine



Abstract

The dynamic inspection and reverse engineering of specular freeform surfaces is a challenge so far largely unsolved. Products produced in high quantities in industrial environments are still inspected manually which is labour intensive, expensive, monotonous and subjective. We propose a novel deflectometric hardware setup and methodology to overcome this shortfall. The reflection of a line laser from a moving specular surface is captured on a translucent screen. The resulting complex line provides detailed data about the surface gradients at the intersection of the laser light plane and the surface but cannot create correspondence between points of reflections and surface points. The latter is inherent in a traditional active light scanning setup whose data alone will, for specular surfaces, be subject to high levels of noise. We propose a novel method that by simulation of the reflection fuses the two data sets to allow digitalising moving specular surfaces with the high slope sensitivity of deflectometric methods. © 2012 Elsevier Ltd.

Citation

Smith, L. N., Smith, M. L., Atkinson, G. A., Wedowski, R. D., Atkinson, G., Smith, M., & Smith, L. (2012). Dynamic deflectometry: A novel approach for the on-line reconstruction of specular freeform surfaces. Optics and Lasers in Engineering, 50(12), 1765-1778. https://doi.org/10.1016/j.optlaseng.2012.07.003

Journal Article Type Article
Publication Date Dec 1, 2012
Journal Optics and Lasers in Engineering
Print ISSN 0143-8166
Publisher Elsevier
Peer Reviewed Peer Reviewed
Volume 50
Issue 12
Pages 1765-1778
DOI https://doi.org/10.1016/j.optlaseng.2012.07.003
Keywords specular free-form surfaces, dynamic inspection, defect detection, multi-scale line extraction
Public URL https://uwe-repository.worktribe.com/output/956337
Publisher URL http://dx.doi.org/10.1016/j.optlaseng.2012.07.003