Mohamed Shaik Honnurvali
Measurement, modeling and simulation of photovoltaic degradation rates
Honnurvali, Mohamed Shaik; Gupta, Naren; Goh, Keng; Umar, Tariq
Authors
Naren Gupta
Keng Goh
Dr. Tariq Umar Tariq.Umar@uwe.ac.uk
Senior Lecturer in Construction Project Management
Abstract
Photovoltaic degradation rates play a vital role in visualizing and analyzing the performance of the PV modules over the long run. A site survey is conducted to calculate PV degradation rates. The results have shown that for the first three years since the initial installation, the degradation rates have remained in line with the manufacturer values (i.e., less than 0.6%), while the next two years the degradation rates have almost increased by 40%. This is due to discoloration of the encapsulant causing the reduction of the short circuit current (Isc). Mathematically, modeling such visual loss factors has not considered so far. The visual loss factor equation is developed and incorporated in the output current equation of the PV module. Further, the I-V curves are simulated and compared with the measured I-V curves. The results have shown an acceptable error percentage of around 0.3%.
Presentation Conference Type | Conference Paper (published) |
---|---|
Conference Name | International conference on Modelling, Simulation and Intelligent Computing |
Start Date | Jan 29, 2020 |
Acceptance Date | Dec 15, 2019 |
Online Publication Date | Jul 29, 2020 |
Publication Date | 2020 |
Deposit Date | Feb 13, 2022 |
Publicly Available Date | Feb 15, 2022 |
Publisher | Springer Verlag |
Volume | 659 |
Pages | 56-63 |
Series Title | Lecture Notes in Electrical Engineering |
Book Title | MoSICOM 2020 : International Conference on Modelling, Simulation and Intelligent Computing |
ISBN | 9789811547744 |
DOI | https://doi.org/10.1007/978-981-15-4775-1_7 |
Keywords | PV (Photovoltaics); STC (Standard test Conditions); Short circuit current (Isc) |
Public URL | https://uwe-repository.worktribe.com/output/8661917 |
Publisher URL | https://link.springer.com/chapter/10.1007/978-981-15-4775-1_7 |
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Copyright Statement
This is the author's accepted manuscript. The final published version is available here:
https://doi.org/10.1007/978-981-15-4775-1_7
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