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Application of the local approach to predict load history effects in ferritic steels

Mirzaee-Sisan, Ali; Mahmoudi, Amir-Hossein; Truman, Christopher E.; Smith, David J.

Authors

Ali Mirzaee-Sisan

Amir Mahmoudi Amir.Mahmoudi@uwe.ac.uk
Senior Lecturer in Engineering Principles

Christopher E. Truman

David J. Smith



Abstract

The effect of residual stresses on fracture behaviour of ferritic steels at low temperature has been investigated using a local approach based on the Beremin model [1]. The study aims to enhance the use of local approach in failure prediction when residual stress is present. A tensile residual stress field has been introduced in the laboratory specimens and their subsequent behaviour was investigated at low temperature. Local compression methods, including side-punching and in-plane loading, were employed to introduce residual stress fields. These methods are discussed and comprehensive range of experimental presented. The transferability of the Weibull parameters between the cracked specimens with different constraint, test temperatures and also from unstrained specimens to specimens with residual stresses are illustrated. The general scheme in failure prediction using the local approach is that the Weibull parameters in the Beremin type model calibrated to the as-received data should predict the failure following complex interaction of residual and applied stresses. The paper compares the predictions and the experimental results.

Presentation Conference Type Conference Paper (published)
Conference Name ASME 2005 Pressure Vessels and Piping Conference
Start Date Jul 17, 2005
End Date Jul 21, 2005
Online Publication Date Jul 29, 2008
Publication Date Jul 29, 2008
Deposit Date Sep 13, 2024
Publisher American Society of Mechanical Engineers
Peer Reviewed Peer Reviewed
Pages 331-337
Book Title ASME 2005 Pressure Vessels and Piping Conference
DOI https://doi.org/10.1115/pvp2005-71606
Public URL https://uwe-repository.worktribe.com/output/12888913
Additional Information https://asmedigitalcollection.asme.org/PVP/proceedings-abstract/PVP2005/331/306787