Determination of the anisotropic elastic properties of rocksalt Ge2Sb2Te5 by XRD, residual stress, and DFT

Cecchini, Raimondo; Kohary, Krisztian; Fern�ndez, Asunci�n; Cabibbo, Marcello; Marmier, Arnaud

Abstract

© 2016 American Chemical Society. The chalcogenide material Ge2Sb2Te5 is the prototype phase-change material, with widespread applications for optical media and random access memory. However, the full set of its independent elastic properties has not yet been published. In this study, we determine the elastic constants of the rocksalt Ge2Sb2Te5, experimentally by X-ray diffraction (XRD) and residual stress and computationally by density functional theory (DFT). The stiffnesses (XRD-stress/DFT) in GPa are C11 = 41/58, C12 = 7/8, and C44 = 8/12, and the Zener ratio is 0.46/0.48. These values are important to understand the effect of elastic distortions and nonmelting processes on the performances of increasingly small phase change data bits.

• Journal Article Type: Article
• Acceptance Date: Feb 16, 2016
• Online Publication Date: Feb 16, 2016
• Publication Date: Mar 17, 2016
• Deposit Date: Jun 16, 2016
• Publicly Available Date: Jun 17, 2016
• Journal: Journal of Physical Chemistry C
• Print ISSN: 1932-7447
• Electronic ISSN: 1932-7455
• Publisher: American Chemical Society
• Peer Reviewed: Peer Reviewed
• Volume: 120
• Issue: 10
• Pages: 5624-5629
• DOI: https://doi.org/10.1021/acs.jpcc.5b09867
• Keywords: films, phase change, optical storage, random access memory, elasticity
• Public URL: https://uwe-repository.worktribe.com/output/917649
• Publisher URL: http://dx.doi.org/10.1021/acs.jpcc.5b09867
• Contract Date: Jun 16, 2016