Accuracy of Orbscan II slit-scanning elevation topography
(2002)
Journal Article
Purpose: To establish the accuracy of Orbscan II (Orbtek Inc.) slit-scanning elevation topography in analyzing the anterior surface of complex test objects. Setting: Discipline of Ophthalmology, University of Auckland, Faculty of Medical and Health S... Read More about Accuracy of Orbscan II slit-scanning elevation topography.