Frammelsberger, W., Benstetter, G., Stamp, R., Kiely, J., & Schweinboeck, T. (2005). Simplified tunnelling current calculation for MOS structures with ultra-thin oxides for conductive atomic force microscopy investigations. Materials Science and Engineering: B, 116(2), 168-174. https://doi.org/10.1016/j.mseb.2004.09.027